Spring Lock EIAJ or JEDEC Type Test Clips
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QFP Test Clips - EIAJ Type This ET PQFP Clip® is specifically designed for testing EIAJ or JEDEC metric Plastic Quad Flatpack (PQFP) surface moutned ICs. It piggybacks onto a soldered-in PQFP, and converts the PQFP leads to standard .1" test points, for easy attachment of test instruments. As an option, on most ET PQFP Test Clips you can solder a known "good" PQFP device to the top of the PQFP clip, disable the device at board level, and then run your target system diagnostics. In addition, the PQFP clip can be used to convert a PQFP to any other
IC package type for easy emulation.
CONTACTS: 0.30mm (.010") Sq. pins, Beryllium Copper, gold plated.INSULATION: Liquid crystal polymer. Vectra A-130, black.RATING: 250 VRMS Max., 5 Amps, +110°C (+230°F) Max. |
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2) Select lead pitch and body size. Tolerance on body size is +/- .4mm. 3) Calculate critical dimension. Tolerance on Critical Dimension is .4mm. See example below.
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NOTE: PLEASE SUPPLY YOUR PACKAGE OUTLINE DRAWING WITH ALL TEST CLIP ORDERS! 
