Emulation Technology - Probe Set and Replacement Tips

SMD Oscilloscope Test Probe Family

Designed to provide high performance, reliable SMD testing

SMD Test Probes

Each of the test probes features a sharp, spring-loaded tip to assist users needing to test within an SMD environment where space is limited and the test points are difficult to reach. ET's family of test probes provide testing capability within a variety of applications ranging from low mass, low impedance measurements to probing high power discrete components. meters.

Features and Benefits:

Spring contact minimizes pressure on DUT and prevents slippage on the board surface
Laser trimmed hybrid circuitry improves accuracy and reliability
Reed relay switch with a shielded X10 position prevents accidental operation
Fast rise times
True frequency response

ET Part Number (click to buy)	Application	Characteristics	Drawing #
ET-PMV511	Timing & voltage high impedance measurements	10 Mohms, 15 pF bandwidths to 500 MHz	PDF
ET-PMM501	Low mass, general purpose, high impedance measurements	10 Mohms, 10 pF	PDF
ET-PMMZ511	Low-mass, low impedance measurements	450 to 950 ohms, 1.5 pF	PDF
ET-PHV641-L	Probing high power discrete components	66 Mohms, 3pF 100:1 for measurements to 2 kV	PDF
ET-PHV4002-3	Switching power supply, power transmission	1000:1 divider for measurements to 30 kV	PDF
ET-PMTG321	General purpose for work bench or field service	10 Mohms, 15 pF or 1 Mohm, 50 pF	PDF

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Fax: (408) 982-0664